grazing-incidence asymmetric Bragg diffraction, in-plane diffraction and/or X-ray reflectivity measurements. An in-plane diffraction analysis of polycrystalline Co-alloy thin-fdm recording media reveals lateral structural anisotropy in high- density recording media. In-plane diffraction and reflectivity measurements of an organosilane

A high-intensity grazing-incidence X-ray diffractometer system, which uses a parabolic graded multilayer mirror and an 18-kW rotating-anode generator, has recently been developed for the structural characterization of surfaces and thin film~. Its goniometer has two in-plane tp/20 x axes and two conventional m¢20 axes for measurements of in-plane and out-of-plane diffraction, respectively. The diffractometer can be used for grazing-incidence asymmetric Bragg diffraction, in-plane diffraction and/or X-ray reflectivity measurements. An in-plane diffraction analysis of polycrystalline Co-alloy thin-fdm recording media reveals lateral structural anisotropy in highdensity recording media. In-plane diffraction and reflectivity measurements of an organosilane monolayer prepared by Langmuir method on a silicon substrate were also successfully made.